E-news CAS 2017, No. 2
10th of April, 2017

The contributed papers for CAS 2017 can be uploaded until 25th of May, 2017, at http://www.epapers.org/cas2017

Reminding you: “IEEE International Semiconductor Conference- CAS 2017” (www.imt.ro/cas) will take place in the mountain resort Sinaia, Romania between 11th   and 14th of October, 2017 (see www.imt.ro/cas). The 40th edition of this conference is organized by the National Institute for Research and Development in Microtechnologies, Bucharest (IMT-Bucharest), under the aegis of IEEE-Electron Devices Society, Ministry of Research and Innovation, Romanian Academy and IEEE-Romania Section & Electron Devices Chapter.

You are invited to submit original papers related to the following domains:

  • Nanoscience and Nanoengineering  
  • Micro- and Nanophotonics
  • Microwave and Millimeter Wave Circuits and Systems
  • Microsensors and Microsystems
  • Modelling
  • Semiconductor Devices
  • Integrated Circuits

Contributed papers will be selected on the basis of an extended abstract, structured according to the IEEE format (4 pages A4, two columns, including a 50 words summary, figures and references).

Your option for the conference (sub)domain (see above) is mandatory. You can suggest either oral or poster presentation, but the final decision will be taken (once your paper is selected) by the Program Committee

As already mentioned above, the web address for up-loading your paper for CAS 2017 Conference is http://www.epapers.org/cas2017
                              
Please note that all messages related to your will come from [email protected].

Deadline for submission: May 25th, 2017
Notification of acceptance: July 15th, 2017

IMPORTANT.

  • All papers accepted for the conference will be included in the Conference Proceedings.
  • Papers presented at the conference will appear in IEEE Xplore.
  • An extended version of selected papers may be submitted for inclusion in a special issue of an indexed journal.

Invited papers at CAS 2017 (to be updated)

  • “Graphene-based Tunable Microstrip Attenuators and Patch Antenna”, Stefano Bellucci, INFN-Laboratori Nazionale di Frascati
  • “Autonomous Wireless Sensor Networks integrated on flexible substrate”, Daniela Dragomirescu, Toulouse University, France
  • “New Trends in High Voltage MOSFET Based on Wide Band Gap Materials”,Philippe Godignon, Centro Nacional de Microelectronica, Barcelona
  • “New Ideas of Quantum Cascading for THz and LEDs”, Hans Hartnagel, Technical University Darmstadt, Germany
  • "Angular Rate Sensors for Inertial Navigation Applications: Design and Calibration Challenges",  Daniel Lapadatu, AlfaRom Consulting
  • “Near-Field Microwave Techniques for Micro- and Nano-Scale Characterization in Material Science”, Romolo Marcelli, Microwave Micro- and Nano-System Technology Group, CNR-IMM Roma, Italy
  • “Silicon Nanomaterials for Li-ion Energy Storage Microsystems”, Sorin Melinte,  Université Catholique de Louvain, Belgium
  • “Ageing effects on composite nano carbon based materials”, Federico Micciulla, Laboratori Nazionali di Frascati - I.N.F.N, Frascati (Rm) Italy
  • “Current trends for developing novel functional metal oxides”, Mircea Modreanu, Tyndall Institute, Cork, Ireland
  • “Ge nanostructures for light absorption”, Antonio Terrasi, University of Catania, Italy
  • “Functional 2D and 3D architectures of nanomaterials: New avenues for applications”, Ion Tigynianu, Academy of Sciences and Technical University of Moldova, Republic of Moldova
  • “Cambridge technology platform for CMOS ubiquitous micro sensors”, Florin Udrea, Univ. of Cambridge, UK
  • “Si-based Transistor and Analog-Mixed-Signal Circuit Scaling and the Natural Progression of Moore's Law to Silicon Quantum Computing at the Atomic Scale”, Sorin Voinigescu, Toronto University, Canada
  • “Technology and performance of SiC-based Nanowire Field Effect Transistors”, Konstantinos Zekentes, Foundation for Research and Technology - Hellas, Crete

Other invited speakers:

Matthias Bucher, Technical Univ. of Crete
Klas Hjort, Uppsala Univ, Sweden
George Konstantinidis, FORTH IESL MRG, Heraklion, Greece

For detailed information about the 40th edition of the CAS conference see www.imt.ro/cas

Organizing Committee,
IMT Bucharest, Romania