PROFILE

The International Semiconductor Conference, an IEEE event since 1995, has in 2017 its 40th edition. The Conference targeting not only semiconductor electronics, but also micro-and nanotechnologies (including micro-nanosystems). The plenary sessions are devoted to invited talks giving a broader perspective of the domain, whereas oral and poster sessions contain regular papers, selected by a board of reviewers. Sometimes, oral sessions are including invited papers. A special session is devoted to student papers. Conference papers are published in Proceedings and made available by IEEE Xplore.
The main scientific profile is related to:

• Simulation and fabrication of microstructures and microsystems: surface and bulk micromachining, microengineering techniques, electro-opto-mechanical microsystems, integration of microsensors and microactuators, signal processing, computational intelligence and system interfacing, biosensors and microsystems for biomedical applications; optical, opto-electronic and photonic functional components, RF MEMS (Radio-Frequency Micro-Electro-Mechanical Systems);
• Science and technology of nanostructures and nanostructured materials: composite nanoparticles and nanostructures with selective properties, nanostructures and nanostructured materials with special properties, nanotechnologies and nanostructures;
• Semiconductor device physics and technology: device modelling and simulation, silicon and compound semiconductor devices, heterostructures, advanced materials and processes, reliability and defect engineering;
• Design and technology of microelectronic components: microelectronic, microphotonic and microwave integrated subsystems, devices and modules for power control and conversion, specialized electronic circuits integrated in the microelectronic technology, testing and reliability.