RESURSE

• Pliant NANOMORPH [...]
• Microscop SPM (Scanning Probe Microscope) de inalta performanta (in curs de achizitie)
• Microscop electronic TESCAN VEGA LMU
• Microscop AFM home-made

	•Microscop SPM (Scanning Probe Microscope) Ntegra Aura (NT-MDT) Caracteristici: • domeniul de scanare: 100x100x10 μm • dotat cu senzori capacitivi • nivel de zgomot: XY: 0,3 nm, Z: 0,06 nm •  nelinearitate X, Y in modul closed-loop     < 0.15 %.
	•Microscop Electronic de Baleiaj (SEM) Vega II LMU (Tescan) Caracteristici: • rezolutie: 3 nm @ 30 kV • tensiune de accelerare: 200V-30 kV • tun electronic: filament W • marire: 13X – 1.000.000X • detectori: SE, BSE, LVSTD
	Microscop AFM home-made