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Services:
Access to services:
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free of charge in case of project cooperation with IMT-Bucharest/Laboratory;
- otherwise please contact the project manager for the cost of services offered by the laboratory;
Contact Person: Phys. Adrian Dinescu
Access programme: Monday-Friday: 10.00-16.00
RESEARCH
Single wall carbon nanotubes (SWCNTs) |
Silicon nanowires
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- Materials & Sample Preparation
Etching of a thin Cr layer
Nano-holes in PMMA. Applications in AFM tip characterization
Length measurements performed on a test sample
- Device Testing and Characterization
Electrical test fixture for CNTs measurements |
SAW device for microwave applications
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INDUSTRY
- Macro Sample to Nanometer Metrology
Chrome on glass photolithographic mash
- Particle Detection and Characterization
Ag nanoparticles
SEMICONDUCTOR & DATA STORAGE
- Circuit Edit (lab)
- Defect analysis (near fab/lab)
- Failure analysis (near fab/lab)
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