Services:
Access to services:
-
free of charge in case of project cooperation with IMT-Bucharest/Laboratory;
- otherwise please contact the project manager for the cost of services offered by the laboratory;
Contact Person: Phys. Adrian Dinescu
Access programme: Monday-Friday: 10.00-16.00
RESEARCH
![](images/5amic.jpg)
Single wall carbon nanotubes (SWCNTs) |
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Silicon nanowires
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- Materials & Sample Preparation
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Etching of a thin Cr layer
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Nano-holes in PMMA. Applications in AFM tip characterization
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Length measurements performed on a test sample
- Device Testing and Characterization
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Electrical test fixture for CNTs measurements |
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SAW device for microwave applications
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INDUSTRY
- Macro Sample to Nanometer Metrology
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Chrome on glass photolithographic mash
- Particle Detection and Characterization
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Ag nanoparticles
SEMICONDUCTOR & DATA STORAGE
- Circuit Edit (lab)
- Defect analysis (near fab/lab)
- Failure analysis (near fab/lab)
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