Laboratory of Micro/Nanophotonics
Head of the Laboratory: Dr. Dana Cristea
SERVICE OFFER
A. Characterization
B. Modelling, Simulation, CAD
C. Education and TRaining in Microphotonics
A. Characterization
Near Field Scanning Optical Microscopy (Alpha300 S System)
Operating modes:
- Near field optical microscopy: transmission, reflection, collection, fluorescence:
- Near field characterization of photonic devices (waveguides, photonic crystals, plasmonic systems)
- Characterization of active devices
- Imaging of biological systems with subwavelength resolution
- Fluorescence measurements
- Confocal microscopy: transmission, reflection, fluorescence:
- Characterization and imaging of biological and polymer samples with diffraction limited resolution
- Atomic force microscopy: contact and AC – Mode
Applications:
- imaging the optical properties of a sample with resolution below the
diffraction limit with applications in nanotechnology, nanophotonics, nanooptics and plasmonics;
- Materials research and polymers;
- Single molecule detection;
- Life sciences;
- Fluorescence characterizations;
Characterization of photonic devices and microoptical systems
- Experimental setup for measuring the spectral characteristic of photonic devices operating at 1550 nm.
- Characterization of microoptical components at various wavelengths in visible and infrared
OPTOLAB laboratory
OPTOLAB is a laboratory for studying and testing of optical and structural properties of thin mono- and multi layers and bulk organic/anorganic materials. The laboratory will be certified to ISO 17025:2005 standard for thin films measurements. The OPTOLAB facilities consist of high performance spectroscopic ellipsometer, SE 800 XUV from SENTECH, high resolution Raman spectrometer, LabRAM HR from HORIBA Jobin Yvon and spectrophotometer for UV_VIS_NIR and IR spectral range from Carl Zeiss Jena.
(i) Ellipsometric measurement of nanometric films - analysis and characterization of the nanometric thin films, interfaces, multi layer structuresfrom different materials - dielectrics, conductive oxides, polymers, emiconductors. Measuring the index of refraction (n) and the extinction coefficient (k) for a single layer permits one to determine the material composition and modeling of optical performance.
Contact person: Dr. Munizer Purica; Florin Comanescu
(ii) Testing the optical properties of samples for the ability to reflect or transmit light by spectrophotometric measurements - thin films characterization by recording the transmistance, absorbance spectra [T(λ), A(λ)] used for optical coatings; surface reflectivity characterization of the texturized and porosified surfaces, material properties: the absorption coefficient and the bandgap for the semiconductor and dielectric films obtained by processing of T(λ) and R(λ).
Contact person: Dr. Munizer Purica, Elena Budianu
(iii) Raman spectroscopy for physical and chemical material analysis of solids, liquids and solutions for chemical identification, characterization of molecular structures; composition and phase (crystalline/amorphous) of composites materials (compound semiconductors, oxidic semiconductors); polymers characterizations and polimer nanocomposites; chemical and biological detection using SERS technique; micro/nano structures characterization (micro/nanorods, carbon nanotubes), self assembled molecule (SAM) on functionalized substrate and other.
B. Modelling, Simulation, CAD
- modelling, simulation CAD for active and passive micro/nano-photonic devices and micro-optics.; customized design (lay-out, technology process) and optimization for
- Photonic integrated circuits;
- MOEMS;
- Micro-optics;
- concept&design studies, development of new tools (customized) especially for “linking” different commercial software to offer a coupled simulation (opto-electro-mechanical analysis)for optical MEMS and sensors. Contact persons: Dr. Cristian Kusko; Dr. Mihai Kusko
- Mask desgn
C. Education and Training in Microphotonics
- undergraduated students;
- master students;
- PhD;
- Engineers;
D. Scientific consultancy in design, process development, characterization, apllications of optoelectronic devices (including photovoltaics), photonic circuits, micro/nano-optic structures, system integration.
