Reliability Laboratory
Head of the Laboratory: Dr. Marius Bazu
- Offer for partnership in FP7 Calls [...] (Expertise, Resources, Participation to European Projects, Publications)
- Offer for scientific and technological services [...] (Profile, Experience in delivering services)
- Offer for training activities [...]
Offer for partnership in FP7 Calls
Main areas of expertise:
Reliability building: Design for reliability and testability - design for manufacture, Reliability monitoring & screening of materials and micro&nanostructures, Burn-in and selection, Reliability of components used in harsh environment (nuclear, geology, automotive, aeronautics, etc.);
Reliability assessing: Accelerated testing of materials and micro & nanostructures; Failure analysis & physics for materials and devices, Data processing & Reliability prediction, Behaviour of electronic components in harsh environment, Virtual prototyping;
Standardisation: Certification, Qualification and periodic tests, Standards and other specifications.
Resources:
Equipment for reliability testing at unique or combined stresses, including calculation of failure rate and other reliability indicators with soft ALTA6 (ReliaSoft), with:
- Climatic Chamber - CH 160 (Angelantoni, Italy) [details]
- Thermal shock chamber - TSE-11-A (Espec Europe, Germany) [details]
- Free Fall Shock Machine - 0707-20 (MRAD, USA) [details]
- Highly Accelerated Stress Test Chamber - temperature, humidity, pressure, polarization - EHS-211M (Espec Europe, Germany) [details]
- Electrodynamic vibration system with thermal and electrical tests - TV 55240/LS (TIRA, Germany) [details]
- Universal Ovens with electrical testing - UFB (Memmert, Germany) N6711A (N6741B, N6743B, N6746B, N6773A) (Agilent Tehchnologies, USA)[details]
Equipment for electrical characterising at various temperatures:
- Semiconductor Characterization System - 4200-SCS, C-V 3532-50, DMM 2700-7700, 2002, 6211-2182 (Keithley Instruments, USA) [details]
- Mobile Thermal Airstream System - ThermoStream TP04300A-8C3-11 (Temptronic, USA) [details]
Equipment for failure analysis and material characterization (with other laboratories of IMT-Bucharest):
- Field Emission Gun Scanning Electron Microscope (FEG-SEM) - Nova NanoSEM 630 (FEI Company, USA) [details]
- Scanning Electron Microscope - Vega II LMU @ Pattern Generator - PG Elphy Plus (TESCAN s.r.o , Czech Republic @ Raith, Germany) [details]
- Scanning Probe Microscope - NTEGRA Aura (NT-MDT Co., Russia) [details]
- Scanning Near-field Optical Microscope - Witec alpha 300S (Witec, Germany) [details]
- Scanning Electrochemical Microscope - ElProScan (HEKA, Germany) [details]
- X-ray Diffraction System (triple axis rotating anode) - SmartLab - 9kW rotating anode, in-plane arm (Rigaku Corporation, Japan) [details]
- High Resolution Raman Spectrometer - LabRAM HR 800 (HORIBA Jobin Yvon, Japan) [details]
- Nanomechanical Characterization equipment - Nano Indenter G200 - (Agilent Technologies, USA) [details]
- UV-VIS-NIR Spectrophotometer - SPECORD M42 (Zeiss, Germany) [details]
- Fourier–Transform Infrared Spectrometer - Tensor 27 (Bruker Optics, Germany) [details]
- UV-Vis-NIR Thermo-Electric Cooled Fiber Optic Spectrometer - AvaSpec-2048 TEC (Avantes, The Netherlands) [details]
- NIR Spectrometer - AvaSpec NIR256-2.2 (Avantes, The Netherlands) [details]
Participation to European Projects:
- The Reliability Laboratory was member of the NoE “Design for Micro and Nano Manufacture - Patent-DfMM” (FP6/IST project 2004-2008), leading the cluster “Reliability & Characterisation”. In the frame of this NoE, IMT/ Laboratory for Reliability was very active, leading many internal projects and establishing scientific relationships with European laboratories focused on the Reliability of Microsystems (IMEC Belgium, Fraunhofer IMS Duisburg Germany, Politecnico di Milano Italy, Lancaster University UK,
IEF-Universite Paris Sud France, QinetiQ UK, Heriot Watt University UK, etc.);
- The Reliability Laboratory is in the Board of the Service Cluster EUMIREL (European MicrosystemReliability), aimed to deliver services in the reliability of micro and nanosystems, set-up in 2007 by the network “Patent-DfMM” (other members: IMEC Leuven, Politecnico di Milano, Fraunhofer Institute
Duisburg, 4M2C, CSL Liege, BME Budapest, Warsaw Technical University, QinetiQ, Lancaster University, Herriot Watt University, NovaMems, Baolab).
Publications:
Books: “Reliability of Electronic Components”, Springer Verlag, February 1999; “Component Reliability for Electronic Systems”, Artech House, October 2009;
Papers in: IEEE Trans. on Reliability, Microelectronics Reliability, Sensors, Solid State Phenomena, J. Electrochem. Soc., etc.;
Contributions to international conferences and symposia: Ann. Reliab. and Maintain. Symp.(ARMS), Proc. Conf. Probabilistic Safety Assessment and Management (PSAM), European Safety and Reliability Conference (ESREL), International Conf. on Computational Intelligence for Modelling, Control and Automation (CIMCA), International Semiconductor Conference (CAS), etc.
Interest in FP7 projects:
The Reliability Laboratory intends to participate to researches aimed to support the competitiveness of
European companies manufacturing electronic components and systems for automotive, avionics, industrial automation, consumer electronics, telecoms and medical systems, in line with Strategic Research Agendas of European Technology Platforms ENIAC (on nanoelectronics), EpoSS (on systems integration), PHOTONICS21 (on photonics) and ARTEMIS (on embedded systems).
Offer for scientific and technological services
Profile:
The Reliability Laboratory is able to deliver a package of scientific services about Materials, Microelectronic devices and Microsystems, containing:
- Environmental & reliability testing;
- Failure & reliability analyses;
- Assessment of reliability parameters;
- Reliability screening for selecting high reliability components
- Consultance / technical assistance on: Reliability analysis for all families of semiconductor devices; Elaborating standards and other documents for various types of electronic components; Qualification of semiconductor devices.
Experience in delivering services:
More than 30 years in delivering services on:
- Screening electronic components for selecting high reliability devices;
- Reliability testing of microelectronic devices and electronic components;
- Thermal aging of components to be used in nuclear plants.
Also, the Reliability Laboratory is in the Board of the Service Cluster EUMIREL (European Microsystem
Reliability), aimed to deliver services in the reliability of micro and nanosystems, set-up in 2007 by the network “Patent-DfMM” (other members: IMEC Leuven, Politecnico di Milano, Fraunhofer Institute Duisburg, 4M2C, CSL Liege, BME Budapest, Warsaw Technical University, QinetiQ, Lancaster University, Herriot Watt University, NovaMems, Baolab).
Offer for training activities
Laboratory for Reliability is able to deliver Training courses on:
- Quality & reliability assurance for semiconductor devices;
- Reliability accelerated testing for MEMS;
- Failure analysis at accelerated testing;
- Characterisation of microelectronic devices and MEMS;
Organization: National Institute for Research and Development in Microtechnologies (IMT-Bucharest)
Country: Romania
Main Activity: Research
Department: Center for Scientific Services
Laboratory: Reliability Laboratory
Mission: Providing tools to improving the design & technology of materials and devices (sensors, actuators, microsystems, nanostructures and microelectronic components) by assessing and building the quality & reliability in a Concurrent Engineering approach.
Contact Person: Marius Bazu
Other Contact Data: PO-BOX 38-160, 023573, Bucharest, Tel.: +40-21-4908412, Fax: +40-21-4908238
