DRIE- Plasmalab System 100-
ICP Deep Reactive Ion Etching System
Contact persons: Andrei Avram, PhD stud; Marioara Avram, PhD
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Applications:
- Etching:
- Bosch process for silicon
- Cryogenic process for silicon
- Bosch Process for SiC
- Single wafer processing.
- Can process 4” or smaller wafers, even small pieces.
- Process gases: SF6, C4F8, O2, Ar.
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General characteristics:
- Single 4” wafer processing
- 5.000 W maximum ICP power
- 300 W maximum substrate electrode power
- Temperature control for substrate electrode
- 2 ultrafast MFC close coupled to the ICP source (for smooth sidewalls)
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Process characteristics are:
- Si etch rate: 7.5 μm/min
- wafer non-uniformity: less than 3%
- wafer to wafer non-uniformity: less than 3%
- etching profile: 90o±1o vertical side-walls
- selectivity: 50:1 for PR mask or 200:1 for SiO2 mask
- aspect ratio: 20:1
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Advantages:
- High etch rate for etching deep trenches
- High ething uniformity
- High selectivity for photoresist and SiO2 masks
- Cryogenic process for perfectly smooth sidewalls
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Last update: February 19, 2009 |
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