Technical characteristics:

Scanning Probe Microscope (SPM) performs 3 dimensional imaging of the topography and studying other physical properties of sample surfaces on a scale from microns down to the nanometric level. Measurements could be done in ambient atmosphere or in controlled atmosphere.

• Scan range: 100x100x10 μm.
• Non-linearity in X, Y with closed-loop sensors < 0.15 %.
• Positioning sensitivity: 2 μm

Description:

The equipment enables several related techniques for high resolution imaging and measuring of surfaces, the properties which could be characterized depending on the chosen technique.
Main applications - in the field of surface metrology, for quantitative measurements of the 3D surface topography for a large variety of samples.
Key advantages of the technique as compared with other microscopies as optical and SEM :  

• ability of measuring the vertical dimensions of the samples together with lateral ones with little or no sample preparation required
• samples could be measured in various environments (normal ambient, controlled gaseous, liquid, low vacuum)

The range of samples that could be imaged: very large, no matter of  the sample conductivity, covering metallic, ceramic, polymeric and semiconducting materials .
Briefly: The SPM microscope could in principle image and perform three dimensional measurements of any surface features from surface roughness to nanometer-sized features.

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Application fields:

• Evaluation and optimization of thin film coatings for various applications (optical, packaging, paintings, wear-resistant etc);
• High-resolution surface profilometry;
• Grain and particle size analysis;
• Surface cleaning and polishing studies  (Characterization of optical surfaces roughness, electro-polished metal surface evaluation etc);
• Microstructural studies (Pharmaceutical, Polymers);
• Morphological studies of biological and biocompatible materials;
• Virtually any other field where nanometer-sized surfaces are concrened;

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Examples of provided services:

• Surface morphology inspection;
• Quantitative measurement of  surface features at nanometric level;
• Nano-surface texture/ roughness measurement;

Partneship:

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Last update: March 5, 2012