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CURRICULUM VITAE 

  First name: Adrian

  Surname : Dinescu

  Date and place of birth: 20.08.1968 , Brasov, Romania

  Education :

  1987-1993, Graduated in " Solid State Physics", Faculty of Physics, University of Bucharest.
  Ph.D. fellow, University of Bucharest, Faculty of Physics

  Professional experience: Optoelectronics, Atomic Force Microscopy

  Career :

  1993-1996 ICCE Bucharest, scientific researcher
  1997-2003 IMT Bucharest, scientific researcher

  Research interests: Scaning Probe Microscopy, Optoelectronic components

  Past and current projects :

  High Efficiency Silicon Solar Cells, 1994-1996, head of project
  Silicon Compatibles Technologies for Photodetectors, 1995-1996, head of project
  Photodetectors with controlled Spectral Caharacteristics, 1997-1998 , head of project
  Force Sensors for Atomic Force Microscopy, 2002-present , head of project

  Main scientific publications: 

  A. Dinescu, R. Gavrila, REFLECTIVITY DECREASE IN TEXTURED SILICON SURFACES USING MICROGROOVES AND INVERTED PYRAMIDS, Proceedings Supplement of the BPL , volume 5 , 2202 –2205, 1997
  M. Negreanu , R. Gavrila, A. Dinescu, TAPERED WINDOWS IN SILICON DIOXIDE LAYERS FOR MASKING AND PASIVATION-OBTAINING AND CHARACTERIZATION METHODS, International Semiconductor Conference -CAS '97, Sinaia, Romania", 243 - 246 (1997)
  A. Dinescu, S. Nastase, R. Gavrila, R. Radoi, St. Iovan, COMPARATIVE STUDY OF MORPHOLOGIC FEATURES INVESTIGATED ON SILICON OXIDE THIN FILMS USING SPECTRO-ELLIPSOMETRY AND AFM , 18th European Conference on Surface Science Conference, Wien, Austria, 1999
  Dinescu A., Radoi R., Gavrila R., Tanase S., Negoiu D. , SURFACE MORPHOLOGICAL FEATURES OF NANOCRYSTALLINE TITANIUM OXIDE LAYERS INVESTIGATED BY SPECTROSCOPIC ELLIPSOMETRY AND ATOMIC FORCE MICROSCOPY, 19th European Conference on Surface Science, Madrid, Spania, 2000
  Dinescu A., Grecea M., Gavrila Raluca, Radoi Rodica, Craciun G. , GROWTH AND CHARACTERIZATION OF ANODIC OXIDE THIN FILMS ON SILICON SUBSTRATES FORMED IN PHOSPHORIC ACID, 2nd International Conference On «Chemical Sciences For Sustainable Development», Halkidiki , GREECE, 2000
  A. Dinescu, M. Danila, E. Manea, R. Muller, R. Gavrila, STRUCTURAL INVESTIGATION OF LPCVD POLY-SILICON LAYERS USED IN SURFACE MICROMACHINING, acceptata pentru CAS 2002
  A. Dinescu, I. Oprea, R. Gavrila, R. Oprica, DETERMINATION OF SCANNING PARAMETERS IN INTERMITTENT CONTACT OPERATION MODE AFM, International Semiconductor Conference - CAS 2001, Sinaia, Romania

  Foreign languages: English, French

Contact information

E-mail: [email protected];
Tel.: +40-21-490.84.12, +40-21-490.82.12 / 32;
Mailing address: 32B, Erou Iancu Nicolae Street, R-72996, Bucharest, ROMANIA