RESEARCH AREAS
 
  Structuring technologies at the nano scale based
on Electron Beam Lithography and related techniques
   
  - developing and refining nano-structuring technologies based on Electron Beam Lithography patterning;
  - design and fabrication of  nanostructures by EBID and EBIE;
  - high aspect ratio structures at nm scale fabricated through EBL-based techniques;
  - methods for nano-structuring non-conductive surfaces (glass, quartz, ceramics);
  -  fabrication of 2D and 3D nanostructures intended to be used as calibration gratings for  optical microscopy,  AFM and  STM with better than 100 nm accuracy;
  - additive methods for fabrication of nano-interconnects on various substrates: lift-off for metals and dielectrics by using special methods for exposure and treatment of electronresist, lithography with double layer etc;
 
 
 
 
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  Micro and nanoscale characterization
   
 
Scanning Probe Microscopy
 

- AFM applications to nanomechanical characterization of polymeric surfaces

  • Studies of the elastic, viscoelastic and adhesive properties of polymeric materials by AFM and related techniques;

- Complementary characterization of surfaces by advanced SPM techniques

  • Conceptual and practical implementation issues associated with the application of Scanning Probe techniques for characterization of materials for micro and nanoelectronics.
  • Studies of organic polymers and blends
  • Studies of graphene materials
  Scanning Electron Microscopy
  - High resolution – low voltage FEG- SEM imaging
  Nano-Indentation
 
 
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Last update: March, 2012