FACILITIES

The Reliability Laboratory (L7) is aimed to evaluate the quality and reliability of microtechnology products according to EU requirements, being provided with modern equipment (purchased in 2007-2009) for:

 
 
  Electrical characterization at various temperatures:

Electrical characterization: 4200SCS system (Keithley): Voltage CC<100V, Current CC<1A; Impulses: analogical signal 30V, <40MHz; Measurements: Voltage 0,5 μV, Current 1 fA.

Temperature conditioning: Temptronic TP04300A-8C3-11 / Thermo Stream - Temperature variation: from - 80oC to +250oC Transition time: up 7 sec, down 20 sec; Temperature control +/- 0,1oC.
   
 
Environmental testing: Constant mechanical acceleration, Vibration, Storage at temperature, Hermeticity, Mechanical shock with free fall:
Equipment for shock with free fall (MRAD): Maximum acceleration 4500 g; Maximum height: 60 in; Maximum speed at impact: 200 in/sec; Minimum time duration: 0,3 ms

Results obtained with the equipment for shock with free fall (MRAD): Maximum acceleration 4500 g; Maximum height: 60 in; Maximum speed at impact: 200 in/sec; Minimum time duration: 0,3 ms

   
  Testing at combined stresses: Damp heat, Thermal cycling, Pressure + Temperature, Thermal stress + Electrical stress, Electrical stress + Thermal stress + Humidity + Vibrations,
  Electrical stress + Thermal stress + Pressure, Mechanical (“Tilting”) + Thermal stress.
Chamber for Highly Accelerated Stress Test (HAST) - EHS 211M (Espec): Temperature range: +105 ... +142oC, Humidity range: 75%…100% RH, Pressure range: 0.02…0.196.
Chamber for testing at temperature + low pressure - VO400 (MEMMERT):  49 l; +20 ... +200°C; 10 ... 1100 mbar
  Failure analysis: IR microscope SC 5600 +  G3 L0605 / FLIR Systems. This is the only equipment located in the MINAFAB area.
Thermal map of an electronic system, obtained with IR microscope. The colour scale corresponds to the temperature: from blue (the lowest temperature), to red (the highest one).
   

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Last update: January 18, 2012