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MAIN PUBLICATIONS
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Books by prestigious publishing houses (USA, Germany) |
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M. Bazu, T. Bajenescu, Failure analysis. A practical guide for manufacturers of electronic components and systems, J. Wiley & Sons, 2011, ISBN 978-0-470-74824-4.
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T. Bajenescu, M. Bazu, Component reliability for electronic systems, Artech House, 2010, ISBN-10: 1-59693-436-0.
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T. Bajenescu, M. Bazu, Reliability of electronic components, Springer, 1999, ISBN-3-540-65722-3.
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Papers in ISI journals |
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M. Bazu, L. Galateanu, V. E. Ilian, J. Loicq, S. Habraken, J.-P. Collette, Quantitative Accelerated Life Testing of MEMS Accelerometers, Sensors, 2007, Vol. 7, pp. 2846-2859.
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M. Bazu, A combined fuzzy/logic & physics of failure approach to reliability prediction, IEEE Transactions on Reliability, Vol. 44, no. 2, 1995, pp. 237-242.
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L.Galateanu, V.E.Ilian, M.Bazu, V.L.M. Ilian, Stand for the mechanical and climatic testing of micro-systems, Patent no.122964 / 28.05.2010.
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V.E. Ilian, L.Galateanu, M.Bazu, V.L.M.Ilian, Process for mechanically testing MEMS devices, Patent no. 122963 / 28.05.2010.
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L. Galateanu, M. Bazu, V.E. Ilian, Proceeding for reliability selection of semiconductor chips with p-n junctions, based on the optical acceleration of generation-recombination at deep levels, Patent no. 126169 / 30.03.2011.
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L. Galateanu, M. Bazu, V.E. Ilian, Enzymatic microbiosenzor for organophosphorus insecticides detection by a flow injection analysis, REGISTERED under A-01264/ 30.11.2010.
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L. Galateanu, V. Ilian, M. Bazu, N. Cimpoca, Constructive system for making microsensors based on microorganisms photosynthesis inhibition process, REGISTERED under A-00329/ 17.05.2007.
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L. Galateanu, V. Ilian, M. Bazu, C. Podaru, Micro-biosensor for diuron detection, based on photosynthesis inhibition at cyanobacteria, REGISTERED under A-00330/ 17.05.2007.
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Papers in other international journals |
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M. Bazu, V.E. Ilian, L. Galateanu, A New Challenge - the Nanoreliability, Bulletin of Micro and Nanoelectrotechnologies, Vol. 2, no.1, March 2011, pp. 7-11.
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M. Bazu, Influence of semiconductor material quality on the reliability of active electronic components, Quality Assurance, No. 68, Oct. – Dec. 2011.
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M. Bazu, V. Ilian, L. Galateanu, Typical Failure Mechanisms of Microsystem Technology, Quality Assurance, nr. 65, January – March 2011.
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M. Bazu, T. Bajenescu, Reliability issues of silicon diodes achieved by bipolar technology, Quality Assurance, nr. 66, April - June 2011.
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M. Bazu, T. Bajenescu, About Reliability Modelling of Electronic Components and Systems, Quality Assurance, nr, 61, January - March 2010.
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M. Bazu, T. Bajenescu, Using failure analysis for building and assessing the reliability of electronic components and systems, Quality Assurance, nr. 64, Oct. – Dec. 2010
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M. Bazu and T, Bajenescu, Designing the Reliability of Electronic Components, Quality Assurance, Vol. XV, No. 59, April-June 2009.
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M. Bazu, C. Tibeică, L. Gălăţeanu, V.E. Ilian, Modern Procedures Evaluating MEMS Reliability, Quality Assurance, Vol. XV, No. 58, January-March 2009.
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M.Bazu, L.Galateanu, V.Ilian, About Nano-Reliability, Quality Assurance, No.55, July-October 2008.
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P. Salomon, M.Bazu, H. Van Herren, S. Lavu, J. Bunyan, M.Desmulliez, The Reliability of Micro Nano Systems, MST News, No.5, 2008, pp. 20-22.
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V. Ilian, M. Bazu, L. Galateanu, V.L.M. Ilian, Nano-Reliability: Fault-Tolerant Architectures for Nanoelectronics, Quality Assurance, No. 55, July - September 2008.
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L. Galateanu, M. Bazu, V. Ilian, C. Tibeica, N. Cimpoca, Cecilia Podaru, I. Ardelean, Lucia Dumitru, M. Grigoras, Maria Ivanoiu, M. Totolin, D. Conduruta, Electrochemical micro-cell for (cyano)bacteria-based biosensors, Romanian Journal of Information Science and Technology, v.9, nr.2, 2006.
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Contributions to international conferences |
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M. Bazu, L. Galateanu, V. E. Ilian, Reliability Accelerated Tests for Microsystems, 34th International Spring Seminar on Electronic Technology - ISSE 2011, High Tatras, Slovakia, May 11-15, 2011.
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M. Bâzu, L. Gălăţeanu, V.E. Ilian, D. Vârşescu, Lifetime prediction for components with scarce data: the “worst case” approach, 2011 IEEE 17th International Symposium for Design and Technology in Electronic Packaging (SIITME), Timisoara, October 2011.
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M. Bazu, V.E. Ilian, L. Galateanu, Typical Failure Mechanisms of Microsystem Technology, 12th International Conference on Quality and Dependability, organised by the Romanian Society on Quality Assurance and IEEE, 21-24 Sept. 2010.
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M. Bazu, V.E. Ilian, L. Galateanu, Reliability Testing of Electronic Components: State-Of-The-Art and New Trends, 12th International Conference on Quality and Dependability, organised by the Romanian Society on Quality Assurance and IEEE, 21-24 Sept. 2010.
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V.E. Ilian, E., Manea, M. Bazu, L. Galateanu, Solar Cells Reliability Testing Programs, 12th International Conference on Quality and Dependability, organised by the Romanian Society on Quality Assurance and IEEE, 21-24 Sept. 2010.
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M. Bazu, L. Galateanu, V. Ilian, About Using Combined Stresses for Reliability Testing of Microsystems, International Semiconductor Conference CAS 2009, October 12-14, 2009, Sinaia, Romania, pp. 233-236;
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M. Bazu, C. Tibeică, L. Galateanu, V. Ilian, “Méthodes modernes pour l’estimation de la fiabilité des microsystèmes”, Premier Colloque Francophone sur lesMatériaux, les Procédés et l'Environnement, 31 mai - 6 juin 2009, Ville de Busteni, Roumanie, pp. 109-112 ;
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L. Galateanu, et al., Building an Electrochemical Micro-Cell for Micro-Biosensors, Proc.of International Semiconductor Conference CAS 2005, 28th edition, Sinaia, Romania, October 3-5, 2004, pp.231-234.
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M. Bâzu, „Concurent Engineering - A Tool for Improving MEMS Research and Manufacturing”, 24th International Conference on Microelectronics (MIEL), Nis, Serbia & Montenegro, 16-19 Mai 2004, pp.41-48
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M. Bâzu, C. Tibeică, L. Gălăţeanu, V.Ilian, Reliability assessment by virtual prototyping of MEMS tunable Faby-Perrot optical cavity, Proc.of International Semiconductor Conference CAS 2004, 27th edition, Sinaia, Romania, October 4-6, 2004, pp.249-253.
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Last update:
January 18, 2012 |
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